Title :
Robust relaxation method for structural matching under uncertainty
Author :
Horiuchi, Takahiko ; Yamamoto, Kazuhiko ; Yamada, Hiromitsu
Author_Institution :
Inst. of Inf. Sci. & Electron., Tsukuba Univ., Ibaraki, Japan
Abstract :
Probabilistic relaxation labeling processes have been widely used in many different fields including image processing, pattern recognition, and artificial intelligence. However it is impossible to express conviction degrees to be related to human subjectivity. We propose a novel relaxation scheme called “robust relaxation” for structural matching under uncertainty. Since this method is constructed on the Dempster-Shafer measure, the above problem can be solved
Keywords :
pattern recognition; probability; uncertainty handling; Dempster-Shafer measure; artificial intelligence; conviction degrees; human subjectivity; image processing; pattern recognition; robust relaxation method; structural matching under uncertainty; Art; Labeling; Layout; Relaxation methods; Robustness; Tiles; Uncertainty;
Conference_Titel :
Pattern Recognition, 1996., Proceedings of the 13th International Conference on
Conference_Location :
Vienna
Print_ISBN :
0-8186-7282-X
DOI :
10.1109/ICPR.1996.546747