• DocumentCode
    2391449
  • Title

    Model space visualization for multivariate linear trend discovery

  • Author

    Guo, Zhenyu ; Ward, Matthew O. ; Rundensteiner, Elke A.

  • Author_Institution
    Comput. Sci. Dept., Worcester Polytech. Inst., Worcester, MA, USA
  • fYear
    2009
  • fDate
    12-13 Oct. 2009
  • Firstpage
    75
  • Lastpage
    82
  • Abstract
    Discovering and extracting linear trends and correlations in datasets is very important for analysts to understand multivariate phenomena. However, current widely used multivariate visualization techniques, such as parallel coordinates and scatterplot matrices, fail to reveal and illustrate such linear relationships intuitively, especially when more than 3 variables are involved or multiple trends coexist in the dataset. We present a novel multivariate model parameter space visualization system that helps analysts discover single and multiple linear patterns and extract subsets of data that fit a model well. Using this system, analysts are able to explore and navigate in model parameter space, interactively select and tune patterns, and refine the model for accuracy using computational techniques. We build connections between model space and data space visually, allowing analysts to employ their domain knowledge during exploration to better interpret the patterns they discover and their validity. Case studies with real datasets are used to investigate the effectiveness of the visualizations.
  • Keywords
    data mining; data visualisation; data space; domain knowledge; linear pattern discovery; model space visualization; multivariate linear trend discovery; Computer science; Data analysis; Data mining; Data visualization; Extraterrestrial phenomena; Navigation; Pattern analysis; Predictive models; Scattering; User interfaces; Knowledge Discovery; model space visualization; multivariate linear model construction; visual analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Visual Analytics Science and Technology, 2009. VAST 2009. IEEE Symposium on
  • Conference_Location
    Atlantic City, NJ
  • Print_ISBN
    978-1-4244-5283-5
  • Type

    conf

  • DOI
    10.1109/VAST.2009.5333431
  • Filename
    5333431