Title :
Load-pull characterization method using six-port techniques
Author :
Ghannouchi, Fadhel M. ; Bosisio, Renato G. ; Demers, Yves
Author_Institution :
Microwave Res. Lab., Ecole Polytech. of Montreal, Que., Canada
Abstract :
The ability of the six-port technique to perform simultaneous measurements of microwave impedance and power flow at an arbitrary reference plane has been bound to be directly applicable to load-pull characterization. This technique avoids the use of additional directional couplers and power meters generally needed in microwave power flow measurements. An experimental six-port network analyzer has been used as a load-pull system in an active load tuning configuration. Experimental results for a microwave transistor characterization confirm the validity of this method. This technique uses less hardware than conventional methods and provides a comparable accuracy
Keywords :
Schottky gate field effect transistors; electric impedance measurement; microwave measurement; network analysers; power measurement; semiconductor device testing; solid-state microwave circuits; MESFET; active load tuning configuration; arbitrary reference plane; load-pull characterization; microwave impedance; microwave power flow measurements; microwave transistor; six-port network analyzer; six-port techniques; Directional couplers; Fluid flow measurement; Hardware; Impedance measurement; Load flow; Microwave measurements; Microwave theory and techniques; Microwave transistors; Performance evaluation; Power measurement;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1989. IMTC-89. Conference Record., 6th IEEE
Conference_Location :
Washington, DC
DOI :
10.1109/IMTC.1989.36918