Title :
Quantum, Power, and Compound Semiconductor Devices - Devices and Passives for Si RF Power
Keywords :
Inductors; Integrated circuit reliability; Integrated circuit technology; MOSFETs; Paper technology; Power integrated circuits; Radio frequency; Semiconductor device modeling; Semiconductor devices; Stress;
Conference_Titel :
Electron Devices Meeting, 2006. IEDM '06. International
Conference_Location :
San Francisco, CA
Print_ISBN :
1-4244-0438-X
DOI :
10.1109/IEDM.2006.346997
