• DocumentCode
    2391655
  • Title

    Fundamental Power and Frequency Limits of Deeply-Scaled CMOS for RF Power Applications

  • Author

    Scholvin, Jörg ; Greenberg, David R. ; del Alamo, Jesís A.

  • Author_Institution
    MIT, Cambridge, MA
  • fYear
    2006
  • fDate
    11-13 Dec. 2006
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This study compares the RF power performance of 65 nm and 0.25 mum CMOS devices integrated on an advanced 65 nm process, and discusses their power and frequency limitations for the first time. The authors demonstrate output power levels of about 80 mW for 65 nm devices, and 450 mW for 0.25 mum devices when operated at their nominal voltages of 1.0 and 2.5 V respectively. The authors find that output power as well as the maximum frequency is limited by parasitic resistances in the backend. The results provide insight into the performance potential of RF power amplifiers integrated into advanced CMOS technologies in SoC applications
  • Keywords
    CMOS integrated circuits; MMIC power amplifiers; nanoelectronics; system-on-chip; 0.25 micron; 1.0 V; 2.5 V; 65 nm; RF power amplifiers; SoC applications; deeply-scaled CMOS; frequency limits; power limits; CMOS process; CMOS technology; Fingers; Frequency estimation; Power amplifiers; Power generation; Power measurement; Radio frequency; Radiofrequency amplifiers; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2006. IEDM '06. International
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    1-4244-0439-8
  • Electronic_ISBN
    1-4244-0439-8
  • Type

    conf

  • DOI
    10.1109/IEDM.2006.347001
  • Filename
    4154436