DocumentCode :
2392066
Title :
Low standby leakage current power amplifier module made with junction PHEMT technology
Author :
Saka, N. ; Nakamura, M. ; Shimada, M. ; Kimura, T. ; Motoyama, H. ; Hase, I.
Author_Institution :
Micro Syst. Network Co., Sony Corp., Kanagawa, Japan
fYear :
2003
fDate :
9-12 Nov. 2003
Firstpage :
301
Lastpage :
304
Abstract :
A true enhancement-mode junction pseudomorphic HEMT (JPHEMT) with a high threshold voltage (V/sub th/) Of +0.5 V was developed for single-supply power amplifiers. The novel JPHEMT exhibits an extremely low standby leakage current. The leakage current at 25/spl deg/C is 2.2/spl times/10/sup -10/ A/mm and even at 85/spl deg/C is 8.6/spl times/10/sup -9/ A/mm. It is suggested that the leakage current is the lowest among reported enhancement-mode FETs. Moreover, the novel JPHEMT exhibits a high turn-on voltage (V/sub F/) of 1.3 V at 1 mA/mm, which is 100 mV higher than that of a conventional JPHEMT. The PA module performance for 1.95 GHz W-CDMA systems, under conditions of V/sub DS/ of 3.5 V and an adjacent channel leakage power ratio (ACLR) of -37 dBc, demonstrated an output power (P/sub out/) of 26.5 dBm, an associated gain (Gain) of 26 dB and a power added efficiency (PAE) of 47%. The standby leakage current at gate-to-source voltage (V/sub GS/) of 0 V was less than 1 /spl mu/A even at 85/spl deg/C. This high RF-performance, with extremely low leakage current results, indicate that the novel JPHEMT has single-supply amplifier capability.
Keywords :
UHF power amplifiers; leakage currents; modules; power HEMT; 0.5 V; 1 muA; 1.3 V; 1.95 GHz; 25 degC; 26 dB; 3.5 V; 47 percent; 85 degC; InGaP; JPHEMT threshold voltage; PA module; WCDMA systems; enhancement-mode junction pseudomorphic HEMT; low standby leakage current amplifier; power amplifier module; single-supply power amplifiers; Doping; FETs; HEMTs; High power amplifiers; Leakage current; Multiaccess communication; PHEMTs; Performance gain; Power generation; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 2003. 25th Annual Technical Digest 2003. IEEE
Conference_Location :
San Diego, CA, USA
ISSN :
1064-7775
Print_ISBN :
0-7803-7833-4
Type :
conf
DOI :
10.1109/GAAS.2003.1252417
Filename :
1252417
Link To Document :
بازگشت