• DocumentCode
    2392091
  • Title

    Partial discharge pattern recognition based on 2-D wavelet transform and neural network techniques

  • Author

    Tu, Yuming ; Wang, Z.D. ; Crossley, P.A.

  • Author_Institution
    Dept. of Electr. Eng. & Electron., Univ. of Manchester Inst. of Sci. & Technol., UK
  • Volume
    1
  • fYear
    2002
  • fDate
    25-25 July 2002
  • Firstpage
    411
  • Abstract
    Partial discharge (PD) pattern recognition is an important tool in HV insulation diagnosis. A PD pattern recognition approach based on the two-dimensional (2-D) wavelet transform and a neural network is proposed in this paper. The approach uses the 2-D wavelet transform to highlight the detailed characteristics of a three-dimensional (3-D) PD pattern. The feature vectors are then extracted from the seven sub-patterns derived by a three-level wavelet transform and input to a neural network (NN) that implements classification. The recognition rate and reliability are extremely high as compared to the results presented in the literature. It is also suitable for identifying discharges with multiple sources. The capability of the approach was demonstrated by classification of the patterns measured in laboratory experiments.
  • Keywords
    insulation testing; neural nets; partial discharge measurement; pattern recognition; power engineering computing; power transformer insulation; power transformer testing; wavelet transforms; 2-D wavelet transform; 3-level wavelet transform; HV insulation diagnosis; feature vectors extraction; multiple source discharges identification; neural network; neural network techniques; partial discharge pattern recognition; power transformer insulation breakdown testing; recognition rate; recognition reliability; Electrodes; Fault location; Feature extraction; Insulation; Neural networks; Partial discharges; Pattern classification; Pattern recognition; Petroleum; Wavelet transforms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Engineering Society Summer Meeting, 2002 IEEE
  • Conference_Location
    Chicago, IL, USA
  • Print_ISBN
    0-7803-7518-1
  • Type

    conf

  • DOI
    10.1109/PESS.2002.1043267
  • Filename
    1043267