DocumentCode :
2392262
Title :
Effects of jammer and nonlinear amplifiers in MIMO-OFDM with application to 802.11n WLAN
Author :
Chi, David W. ; Das, Pankaj
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of California, San Diego, CA
fYear :
2008
fDate :
16-19 Nov. 2008
Firstpage :
1
Lastpage :
8
Abstract :
It is well known that orthogonal frequency division multiplexing (OFDM) produces high peak to average power ratio (PAPR) and is highly sensitive to both frequency offset and phase noise. The high peak signal often forces practical amplifiers to operate in the nonlinear region. As a result, it causes additional degradation to the systempsilas performance. Since the frequency bandwidth is a scarce resource, wireless communication systems would have to operate in an environment which is prone to unknown interference such as jamming. In this paper, we analyze the joint effect of nonlinear distortion which is produced by nonlinear high power amplifiers (HPAs) and jammer on the performance of a multiple input multiple output (MIMO)-OFDM system in Rayleigh fading channels. In addition, we extend on our previous work to include the situations where there is a frequency offset between jammer and desired signal. For the purpose of simulation, we extend the analytical model to be in compliance with the IEEE 802.11n standard. The theoretical results are verified with the simulation.
Keywords :
MIMO communication; OFDM modulation; Rayleigh channels; jamming; nonlinear distortion; power amplifiers; wireless LAN; 802.11n WLAN; MIMO-OFDM; Rayleigh fading channels; frequency offset; jammer effects; multiple input multiple output system; nonlinear distortion; nonlinear high power amplifiers; orthogonal frequency division multiplexing; wireless communication systems; Analytical models; Bandwidth; Degradation; Interference; Jamming; OFDM; Peak to average power ratio; Phase noise; Wireless LAN; Wireless communication;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Military Communications Conference, 2008. MILCOM 2008. IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-2676-8
Electronic_ISBN :
978-1-4244-2677-5
Type :
conf
DOI :
10.1109/MILCOM.2008.4753061
Filename :
4753061
Link To Document :
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