DocumentCode
2392283
Title
UPFC operations under stressed system conditions
Author
Wu, Xiaohe ; Qu, Zhihua
Author_Institution
Sch. of Electron. Eng. & Comput. Sci., Univ. of Central Florida, Orlando, FL, USA
Volume
1
fYear
2002
fDate
25-25 July 2002
Firstpage
467
Abstract
Power systems often work in stressed conditions nowadays. A unified power flow controller (UPFC) with its capability to regulate significant amounts of real and reactive power flow simultaneously and independently can, at its full capacity, exert effects on the system that are strong enough to be counted as transient events. In the worst scenario, improper operations of UPFC might jeopardize the system stability. In this paper, a mathematical representation is developed for a simple power system with UPFC installed. Insight into the mechanism of UPFC is obtained. Stability criteria are studied for three different UPFC control strategies: fixed parameters control (FPC), in phase voltage control (IPVC) and quadrature voltage control (QVC). It is found out that FPC always has the smallest stability margin, while QVC has the biggest stability margin at stressed conditions, and IPVC has a slightly better result at medium real power output level. Therefore, under stressed conditions, QVC should be employed whenever possible.
Keywords
control system analysis; control system synthesis; flexible AC transmission systems; load flow control; power system transient stability; power transmission control; voltage control; UPFC operations; control strategies; fixed parameters control; mathematical representation; phase voltage control; power system stability margin; quadrature voltage control; stressed system conditions; unified power flow controller; Control systems; Flexible AC transmission systems; Flexible printed circuits; Government; Load flow; Power system stability; Power system transients; Reactive power control; Static VAr compensators; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Engineering Society Summer Meeting, 2002 IEEE
Conference_Location
Chicago, IL, USA
Print_ISBN
0-7803-7518-1
Type
conf
DOI
10.1109/PESS.2002.1043278
Filename
1043278
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