Study of bit error and thermal characterization of a successive approximation A/D converter

The bit weight errors are derived in a real case by Walsh transforming the nonlinearity error measured for a successive approximation A/D converter. The estimates of the bit errors obtained from the differential nonlinearity error and from the integral nonlinearity error are compared on the basis of the experimental conversion characteristic. To force the appearance of sizeable bit errors, a thermal characterization was performed in a wide temperature range