DocumentCode :
2392535
Title :
A novel approach to estimate the impact of analog circuit performance based on the small signal model under process variations
Author :
Kuo, Po-Yu ; Saibua, Siwat ; Zhou, Dian
Author_Institution :
Dept. of Electr. Eng., Univ. of Texas at Dallas, Richardson, TX, USA
fYear :
2011
fDate :
26-28 Sept. 2011
Firstpage :
70
Lastpage :
75
Abstract :
Continuous scaling in CMOS fabrication process makes integrated circuits more vulnerable to process variations. The impact on circuit performance caused by process variations in CMOS circuit is usually analyzed by Monte Carlo method with a large number of simulation runs. This paper proposes a novel approach to estimate the impact of analog circuit performance based on the small signal model under process variations. The accuracy of the small signal model has been verified with CMOS circuit. The proposed approach has been demonstrated by a CMOS two-stage operational transconductance amplifier (OTA). To achieve an accurate estimate, the modified small signal model which consider more parasitic capacitors in CMOS transistor, has been applied in the proposed approach. By applying the proposed approach based on optimization method, the upper and lower bounds of magnitude and phase, can be evaluated accurately in much less computation time compared to Monte Carlo simulations. All experimental results are carried out using a standard 0.35-μm CMOS process technology.
Keywords :
CMOS analogue integrated circuits; Monte Carlo methods; operational amplifiers; optimisation; CMOS fabrication process; CMOS transistor; CMOS two-stage operational transconductance amplifier; Monte Carlo method; OTA; analog circuit performance; integrated circuits; optimization method; process variations; size 0.35 mum; small signal model; Analog circuits; CMOS integrated circuits; Integrated circuit modeling; Mathematical model; Monte Carlo methods; Semiconductor device modeling; Transfer functions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOC Conference (SOCC), 2011 IEEE International
Conference_Location :
Taipei
ISSN :
2164-1676
Print_ISBN :
978-1-4577-1616-4
Electronic_ISBN :
2164-1676
Type :
conf
DOI :
10.1109/SOCC.2011.6085098
Filename :
6085098
Link To Document :
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