Title :
Surface reconstruction of polycrystalline TiO2 in oxygen atmosphere
Author :
Plugaru, R. ; Vasilco, R. ; Piqueras, J. ; Cremades, A.
Author_Institution :
Fac. de Ciencias Fisicas, Univ. Complutense de Madrid, Spain
fDate :
28 Sept.-2 Oct. 2003
Abstract :
Polycrystalline TiO2 surface reconstruction in oxygen atmosphere has been investigated by atomic force microscopy (AFM) and cathodoluminescence in the scanning electron microscopy (SEM-CL). The reactivity to oxygen is related to the presence of defects as interstitial Ti ions, that induce growth of protrusions, large terraces and polygonal shaped structures.
Keywords :
atomic force microscopy; cathodoluminescence; interstitials; scanning electron microscopy; surface reconstruction; titanium compounds; TiO2; atomic force microscopy; cathodoluminescence; interstitial Ti ions; large terraces; oxygen atmosphere; polycrystalline TiO2; polygonal shaped structures; protrusions; scanning electron microscopy; surface reconstruction; Atmosphere; Atomic force microscopy; Grain boundaries; Infrared spectra; Oxygen; Periodic structures; Scanning electron microscopy; Surface reconstruction; Surface topography; Surface treatment;
Conference_Titel :
Semiconductor Conference, 2003. CAS 2003. International
Print_ISBN :
0-7803-7821-0
DOI :
10.1109/SMICND.2003.1252446
