Title :
High reliability built-in self-detection and self-correction design for DCT/IDCT application
Author :
Cheng, Chang-Hsin ; Hsu, Chun-Lung ; Liu, Chung-Kai ; Lin, Shih-Yin
Author_Institution :
Inf. & Commun. Res. Labs., Ind. Technol. Res. Inst., Hsinchu, Taiwan
Abstract :
This paper proposes an efficient built-in self-detection and self-correction techniques to detect and correct error in discrete cosine transform (DCT)/inverse discrete cosine transform (IDCT) based on the biresidue codes. On the other hand, any single bit error of DCT/IDCT can be efficiently detected or corrected. Experimental results show the proposed BISDC architecture has good performance in throughput with reasonable area overhead and high reliability.
Keywords :
built-in self test; discrete cosine transforms; error correction codes; error detection; inverse transforms; reliability; video coding; BISDC architecture; DCT; IDCT; biresidue codes; built-in self detection; discrete cosine transform; error correction; error detection; inverse discrete cosine transform; reliability; self-correction design; Built-in self-test; Computer architecture; Discrete cosine transforms; Error correction codes; Reliability; Throughput;
Conference_Titel :
SOC Conference (SOCC), 2011 IEEE International
Conference_Location :
Taipei
Print_ISBN :
978-1-4577-1616-4
Electronic_ISBN :
2164-1676
DOI :
10.1109/SOCC.2011.6085106