Enhancing the control and efficiency of the covering process [logic verification]

Author

Fine, Shai ; Ziv, Avi

Author_Institution

IBM Res. Lab in Haifa, Haifa Univ. Campus, Israel

fYear

2003

fDate

12-14 Nov. 2003

Firstpage

96

Lastpage

101

Abstract

Coverage directed test generation (CDG) is a technique for providing feedback from the coverage domain back to a generator that produces new stimuli to the tested design. In this paper, we describe two algorithms that act in a CDG framework. The first algorithm controls the coverage events distribution using a "water-filling" approach. The second algorithm improves the efficiency of the covering process using clustering techniques.

Keywords

automatic test pattern generation; belief networks; feedback; formal verification; logic design; logic simulation; logic testing; Bayesian network; CDG framework; clustering techniques; coverage directed test generation; coverage domain feedback; coverage events distribution; feedback-based verification process; functional verification; logic verification; random test generators; simulation based verification techniques; tested design stimuli; water-filling technique; Automatic testing; Bayesian methods; Clustering algorithms; Engines; Event detection; Feedback; Hardware; Random number generation;

fLanguage

English

Publisher

ieee

Conference_Titel

High-Level Design Validation and Test Workshop, 2003. Eighth IEEE International

Conference_Location

San Francisco, CA, USA

Print_ISBN

0-7803-8236-6

Type

conf

DOI

10.1109/HLDVT.2003.1252481

Filename

1252481