Title :
High-level test generation for hardware testing and software validation
Author :
Goloubeva, O. ; Reorda, M. Sonza ; Violante, M.
Author_Institution :
Politecnico di Torino, Italy
Abstract :
It is now common for design teams to develop systems where hardware and software components cooperate; they are thus facing the challenging task of validating and testing systems where hardware and software parts exist. In this paper a high-level test generation approach is presented, which is able to produce input stimuli that can be fruitfully exploited for test and validation purposes of both hardware and software components. Experimental results are reported showing that the proposed approach produces high quality vectors in terms of the adopted metrics for hardware and software faults.
Keywords :
automatic test pattern generation; fault simulation; hardware-software codesign; system-on-chip; adopted metrics; behavioral system descriptions; hardware faults; hardware testing; high quality vectors; high-level fault models; high-level test generation; input stimuli; software faults; software validation; system-level design; system-on-chip; Automatic testing; Genetic mutations; Hardware; Manufacturing; Software testing; Software tools; Specification languages; System testing; System-level design; System-on-a-chip;
Conference_Titel :
High-Level Design Validation and Test Workshop, 2003. Eighth IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-8236-6
DOI :
10.1109/HLDVT.2003.1252488