Title :
Electron-beam charging of plasma-coated spacecraft dielectrics
Author :
Balmain, K.G. ; Wertheimer, M.R.
Author_Institution :
Dept. of Electr. Eng., Toronto Univ., Ont., Canada
Abstract :
Research results are described on the charge accumulation and arc discharging of coated dielectric sheets exposed to a 20-keV electron beam. The dielectric sheet substrates are Kapton and Mylar, and the coatings are plasma-deposited amorphous hydrogenated silicon (a-Si:H), silicon nitride (P-SiN), and silicon dioxide (P-SiO2). Arc discharges are characterized by their current pulse shape and by their appearance as recorded using a CCD (charge coupled device) camera. Results indicate that P-SiO2 and P-SiN coatings on Kapton prevent discharge occurrence. Other coating-substrate combinations do not prevent discharges but do modify them
Keywords :
arcs (electric); dielectric properties of solids; dielectric thin films; electrets; electron beam effects; plasma deposited coatings; Kapton; Mylar; Si:H; SiN; SiO2; amorphous semiconductors; arc discharging; charge accumulation; charge coupled device; coated dielectric sheets; electrets; electron-beam charging; plasma-coated spacecraft dielectrics; Amorphous materials; Arc discharges; Charge-coupled image sensors; Coatings; Dielectric substrates; Electron beams; Plasma devices; Pulse shaping methods; Silicon compounds; Space vehicles;
Conference_Titel :
Electrets, 1991. (ISE 7) Proceedings., 7th International Symposium on (Cat. No.91CH3029-6)
Conference_Location :
Berlin
Print_ISBN :
0-7803-0112-9
DOI :
10.1109/ISE.1991.167306