DocumentCode :
2394417
Title :
Study of loss of load probability in designing installed capacity market
Author :
Yoon, Yong T. ; Felder, Frank A.
Author_Institution :
Sch. of Electr. & Comput. Eng., Oklahoma Univ., Norman, OK, USA
Volume :
2
fYear :
2002
fDate :
25-25 July 2002
Firstpage :
830
Abstract :
In this paper, the authors first review the method of computing loss of load probability (LOLP) as a means of assessing reliability. Then, they relate the method to the installed capacity (ICAP) mechanisms, which are currently being implemented in some regional US electricity markets as a necessary market process for ensuring long term reliability. The basic conclusion of the paper is that the current ICAP mechanisms do not accurately ensure a desired level of reliability, as intended. The reason for this situation is because the current ICAP mechanisms consider the expected value of available generation, which is only the first order simplification of probabilistic generator capacity modeling, while ignoring the second and higher orders. They use simple examples to illustrate this claim and its implications. The incentives created through ICAP mechanisms directly impact the investment decisions of new generation and transmission. Therefore, the findings presented in the paper are critical as we move forward with the restructuring process. To achieve the desired level of reliability through market process, this paper may lead to understanding better the necessary modifications to the current ICAP mechanisms.
Keywords :
load (electric); power markets; power system economics; power system reliability; probability; ICAP mechanisms; US electricity markets; installed capacity market design; long term reliability; loss of load probability; probabilistic generator capacity modeling; Capacity planning; Costs; Electricity supply industry; Energy consumption; Investments; Power generation; Power system reliability; Production; Signal generators; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Engineering Society Summer Meeting, 2002 IEEE
Conference_Location :
Chicago, IL, USA
Print_ISBN :
0-7803-7518-1
Type :
conf
DOI :
10.1109/PESS.2002.1043450
Filename :
1043450
Link To Document :
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