DocumentCode
2394417
Title
Study of loss of load probability in designing installed capacity market
Author
Yoon, Yong T. ; Felder, Frank A.
Author_Institution
Sch. of Electr. & Comput. Eng., Oklahoma Univ., Norman, OK, USA
Volume
2
fYear
2002
fDate
25-25 July 2002
Firstpage
830
Abstract
In this paper, the authors first review the method of computing loss of load probability (LOLP) as a means of assessing reliability. Then, they relate the method to the installed capacity (ICAP) mechanisms, which are currently being implemented in some regional US electricity markets as a necessary market process for ensuring long term reliability. The basic conclusion of the paper is that the current ICAP mechanisms do not accurately ensure a desired level of reliability, as intended. The reason for this situation is because the current ICAP mechanisms consider the expected value of available generation, which is only the first order simplification of probabilistic generator capacity modeling, while ignoring the second and higher orders. They use simple examples to illustrate this claim and its implications. The incentives created through ICAP mechanisms directly impact the investment decisions of new generation and transmission. Therefore, the findings presented in the paper are critical as we move forward with the restructuring process. To achieve the desired level of reliability through market process, this paper may lead to understanding better the necessary modifications to the current ICAP mechanisms.
Keywords
load (electric); power markets; power system economics; power system reliability; probability; ICAP mechanisms; US electricity markets; installed capacity market design; long term reliability; loss of load probability; probabilistic generator capacity modeling; Capacity planning; Costs; Electricity supply industry; Energy consumption; Investments; Power generation; Power system reliability; Production; Signal generators; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Engineering Society Summer Meeting, 2002 IEEE
Conference_Location
Chicago, IL, USA
Print_ISBN
0-7803-7518-1
Type
conf
DOI
10.1109/PESS.2002.1043450
Filename
1043450
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