DocumentCode :
2394457
Title :
Statistical evaluation of non-canonical reverberation chambers
Author :
Weinzierl, D. ; Santos, M.A., Jr. ; Perotoni, M.B. ; Sartori, C. A F ; Cardoso, J.R. ; Kost, A.
Author_Institution :
Centro Univ. de Jaragua do Sul, Jaragua
fYear :
2007
fDate :
Oct. 29 2007-Nov. 1 2007
Firstpage :
630
Lastpage :
633
Abstract :
Mode Stirred Chambers (MSC) are often used to perform Electromagnetic Compatibility (EMC) tests. However, the conventional method is only effective at high frequencies, where there is a large number of propagating modes within the chamber. To extend the frequency of operation of the MSC a new method of exciting the fields has been proposed. This can be achieved by placing a set of wires within the chamber. Since these wires support a transverse electromagnetic (TEM) wave, they are capable of exciting and stirring the fields with no low frequency limitation. The proposed approach is simulated in this work using the Finite Integration Technique (FIT) and the results are statistically treated to verify the electric field distribution within the chamber.
Keywords :
TEM cells; electric fields; electromagnetic compatibility; integration; numerical analysis; reverberation chambers; electric field distribution; electromagnetic compatibility; finite integration technique; mode stirred chambers; noncanonical reverberation chambers; statistical evaluation; transverse electromagnetic wave; Electromagnetic compatibility; Electromagnetic fields; Electromagnetic propagation; Electromagnetic scattering; Frequency; Microwave Theory and Techniques Society; Performance evaluation; Reverberation chamber; Testing; Wires; Reverberation chamber; electromagnetic compatibility; numerical simulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave and Optoelectronics Conference, 2007. IMOC 2007. SBMO/IEEE MTT-S International
Conference_Location :
Brazil
Print_ISBN :
978-1-4244-0661-6
Electronic_ISBN :
978-1-4244-0661-6
Type :
conf
DOI :
10.1109/IMOC.2007.4404342
Filename :
4404342
Link To Document :
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