• DocumentCode
    239451
  • Title

    Inventory survival analysis for semiconductor memory manufacturing

  • Author

    Jei-Zheng Wu ; Yu Hui-Chun ; Chen-Fu Chien

  • Author_Institution
    Dept. of Bus. Adm., Soochow Univ., Taipei, Taiwan
  • fYear
    2014
  • fDate
    7-10 Dec. 2014
  • Firstpage
    2591
  • Lastpage
    2599
  • Abstract
    The high variety of and intermittent demand for semiconductor memory products frequently limits the use of forecast error normalization in estimating inventory. Inventory turnover is a practical performance indicator that is used to calculate the number of days for which a company retains inventory before selling a product. Although previous studies on inventory level settings have primarily applied information regarding demand variability and forecast error, few studies have investigated the inventory turnover for inventory decisions. Inventory turnover data are time scaled, suited for a small sample, and right censored to fit the input of survival analysis. In this study, a model in which inventory turnover and survival analysis were integrated was developed to estimate the production inventory survival function used to determine inventory level. Data analysis results based on real settings indicated the viability of using inventory survival analysis to determine semiconductor memory inventory level settings.
  • Keywords
    data analysis; inventory management; semiconductor device manufacture; semiconductor storage; data analysis; error normalization forecasting; inventory decisions; inventory level settings; inventory survival analysis; inventory turnover analysis; production inventory survival function; semiconductor memory inventory level settings; semiconductor memory manufacturing; semiconductor memory products; Educational institutions; Manufacturing; Production; Safety; Semiconductor device modeling; Semiconductor memory; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference (WSC), 2014 Winter
  • Conference_Location
    Savanah, GA
  • Print_ISBN
    978-1-4799-7484-9
  • Type

    conf

  • DOI
    10.1109/WSC.2014.7020103
  • Filename
    7020103