DocumentCode :
2394522
Title :
A rapid defect detecting algorithm for printed matter on the assembly line
Author :
Ximing Yang ; Shuanhu Wu
Author_Institution :
Sch. of Comput. Sci., Yantai Univ., Yantai, China
fYear :
2012
fDate :
19-20 May 2012
Firstpage :
1842
Lastpage :
1845
Abstract :
To better adapt to defect detection requirements of the industrial printed matter on the assembly line, this paper proposed a rapid defect detection algorithm. First we improved the Surf algorithm and made better the detection of the feature point performance and speed effectively; Second, a new FIFO feature point matching algorithm was introduced that could save feature matching time about 50%; Finally we introduced a two-way image difference algorithm to avoid error detecting for contour artifact. Experimental results showed that the proposed algorithm could meet real-time requirements on assembly line.
Keywords :
assembling; feature extraction; image matching; object detection; production engineering computing; quality control; FIFO feature point matching algorithm; SURF algorithm; assembly line; contour artifact; error detection; feature point performance; first-in first-out; industrial printed matter; rapid defect detection algorithm; speeded-up robust feature; two-way image difference algorithm; Algorithm design and analysis; Assembly; Educational institutions; Feature extraction; Image matching; Standards; Vectors; Defect detection; FIFO feature point matching; Two-way image difference;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Systems and Informatics (ICSAI), 2012 International Conference on
Conference_Location :
Yantai
Print_ISBN :
978-1-4673-0198-5
Type :
conf
DOI :
10.1109/ICSAI.2012.6223405
Filename :
6223405
Link To Document :
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