DocumentCode :
2394968
Title :
Development of power quality monitoring system with central processing scheme
Author :
Won, Dong-Jun ; Chung, Il-Yop ; Kim, Joong-Moon ; Moon, Seung-Il ; Seo, Jang-Cheol ; Choe, Jong-Woong
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., South Korea
Volume :
2
fYear :
2002
fDate :
25-25 July 2002
Firstpage :
915
Abstract :
Power quality monitoring system is the cornerstone of power quality analysis, diagnosis and improvement. Power quality (PQ) measurement concepts are evolving from instantaneous metering to continuous monitoring and developments in measurement technology make PQ monitoring system more powerful. That is, now it is possible to construct a more flexible, reliable, fast and economical PQ monitoring system. This paper presents an improved PQ monitoring system with central processing scheme. The proposed system basically consists of one PQ analyzer and multiple PQ meters. PQ meter only acts as raw data acquisition system and PQ analyzer performs all calculations and analysis algorithm. The proposed system is very economical especially for large-scale system because the price of PQ meter can be dramatically lowered in this scheme. PQ monitoring algorithms to catch steady-state trends and to detect PQ events are also proposed. The prototype of this system is constructed and real-time tests are performed using this system.
Keywords :
computerised monitoring; power supply quality; power system measurement; central processing scheme; multiple power quality meters; power quality analysis; power quality analyzer; power quality diagnosis; power quality improvement; power quality monitoring system; raw data acquisition system; steady-state trends; Algorithm design and analysis; Data acquisition; Large-scale systems; Monitoring; Performance analysis; Power generation economics; Power measurement; Power quality; Power system economics; Power system reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Engineering Society Summer Meeting, 2002 IEEE
Conference_Location :
Chicago, IL, USA
Print_ISBN :
0-7803-7518-1
Type :
conf
DOI :
10.1109/PESS.2002.1043496
Filename :
1043496
Link To Document :
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