• DocumentCode
    2395013
  • Title

    Improved vector compaction for power estimation with multi-sequence sampling technique

  • Author

    Hsu, Chih-Yang ; Liu, Chien-Nan Jimmy ; Jou, Jinx-Yaw

  • Author_Institution
    Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • fYear
    2003
  • fDate
    6-8 Oct. 2003
  • Firstpage
    176
  • Lastpage
    179
  • Abstract
    A fast and accurate power estimation of circuits is definitely required when the low power issues become more and more important. For large circuits, vector compaction techniques could provide a fast solution for power estimation with reasonable accuracy. In previous work, we proposed an efficient vector compaction method with grouping and single-sequence consecutive sampling technique for CMOS circuits. The single-sequence approach improved the losses on compaction ratio and speedup by minimizing the useless transitions in traditional random or random-liked sampling approaches but it still involved some undesired transitions. In this paper, we propose a new consecutive sampling technique, multi-sequence approach. It can dramatically reduce the useless transitions without involving any undesired transitions. Compared to the random sampling and the single-sequence approaches, the experimental results demonstrate that the average compaction ratio and the average speedup can be significantly improved with our multi-sequence approach.
  • Keywords
    CMOS integrated circuits; circuit CAD; integrated circuit design; sampling methods; CMOS circuits; circuit CAD; multisequence sampling technique; power estimation; random sampling; single sequence approach; vector compaction; Batteries; CMOS technology; Character generation; Circuit simulation; Compaction; Computational modeling; Energy consumption; Power engineering and energy; Sampling methods; Tuned circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, Systems, and Applications, 2003 International Symposium on
  • ISSN
    1524-766X
  • Print_ISBN
    0-7803-7765-6
  • Type

    conf

  • DOI
    10.1109/VTSA.2003.1252581
  • Filename
    1252581