Title :
Proceedings IEEE International Conference on Wafer Scale Integration (ICWSI)
Abstract :
The following topics were dealt with: WSI applications; architecture; interconnect and routing; yield and test
Keywords :
integrated circuit design; integrated circuit interconnections; integrated circuit testing; integrated circuit yield; network routing; wafer-scale integration; WSI applications; architecture; interconnect; routing; test; wafer scale integration; yield;
Conference_Titel :
Wafer Scale Integration, 1995. Proceedings., Seventh Annual IEEE International Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-2467-6
DOI :
10.1109/ICWSI.1995.515432
