• DocumentCode
    2395708
  • Title

    Analysis of a x-cut Ti:LiNbO3 electrooptic modulator with a ridge structure

  • Author

    Abe, Nancy M. ; Franco, Marcos A R ; Passaro, Angelo

  • Author_Institution
    Div. of Appl. Phys., Centro Tecnico Aeroespacial, Brazil
  • Volume
    1
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    144
  • Abstract
    An analysis of a Ti:LiNbO3 Mach-Zehnder traveling-wave electrooptic modulator with a ridge structure is presented in this work. The performance of the device is studied assuming x-cut substrate. Two configurations employing ridge structure are compared to a conventional one. This work also presents the influence of some fabrication parameters of the optical waveguide on the factors which evaluates the efficiency of the modulators. The characteristics of both the optical waveguide and the coplanar waveguide electrode are computed applying the scalar finite element method
  • Keywords
    Mach-Zehnder interferometers; electro-optical modulation; finite element analysis; integrated optics; lithium compounds; optical waveguide components; ridge waveguides; titanium; LiNbO3:Ti; Ti:LiNbO3 Mach-Zehnder traveling-wave electro-optic modulator; coplanar waveguide electrode; fabrication; optical waveguide; ridge structure; scalar finite element method; x-cut substrate; Coplanar waveguides; Electrodes; Electrooptic modulators; Optical buffering; Optical device fabrication; Optical modulation; Optical refraction; Optical signal processing; Optical variables control; Optical waveguides;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and Optoelectronics Conference, 1999. SBMO/IEEE MTT-S, APS and LEOS - IMOC '99. International
  • Conference_Location
    Rio de Janeiro
  • Print_ISBN
    0-7803-5807-4
  • Type

    conf

  • DOI
    10.1109/IMOC.1999.867076
  • Filename
    867076
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2395708