• DocumentCode
    2395934
  • Title

    Loss and thermal analysis of semiconductor devices applied to an electric circuit simulator

  • Author

    Cazakevicius, Fabricio E. ; Krug, Rodrigo P. ; Figueira, Henrique H. ; Beltrame, Rafael C. ; Hey, Hélio L.

  • Author_Institution
    Power Electron. & Control Res. Group (GEPOC), Fed. Univ. of Santa Maria (UFSM), Santa Maria, Brazil
  • fYear
    2011
  • fDate
    11-15 Sept. 2011
  • Firstpage
    1050
  • Lastpage
    1055
  • Abstract
    The aim of this paper is to create an education tool to estimate the losses and the dynamic behavior of the junction temperature of a semiconductor device, to be employed in a simulation software of electrical circuits. It must be highlighted that the temperature is one of the most important variables to be controlled in a switch-mode power converter and presents a great impact on converter efficiency and power density. Due to the lack of a simple tool to analyze the thermal behavior of a static converter, this paper proposes an algorithm to predict the losses (conduction and switching) and the temperature behavior in a semiconductor device. Using this algorithm the heat-sink design can be optimized in order to project a converter with high power density. The methodology which easily extracts the loss and thermal models, without huge computational efforts, is demonstrated. The proposed approach can be used as an educational tool, since it can be easily implemented in a circuit simulation software, assisting students of Power Electronics. It is important to note, that experimental results are presented to validate the proposed approach.
  • Keywords
    computer aided instruction; heat sinks; power electronics; power engineering education; semiconductor devices; switched mode power supplies; converter efficiency; dynamic behavior; education tool; electric circuit simulator; heat sink design; junction temperature; power density; power electronics; semiconductor devices; simulation software; static converter; switch-mode power converter; thermal analysis; thermal models; Computational modeling; Integrated circuit modeling; Junctions; Mathematical model; Power electronics; Temperature measurement; Junction temperature; educational tool; power loss; switching loss; thermal model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics Conference (COBEP), 2011 Brazilian
  • Conference_Location
    Praiamar
  • ISSN
    2175-8603
  • Print_ISBN
    978-1-4577-1644-7
  • Electronic_ISBN
    2175-8603
  • Type

    conf

  • DOI
    10.1109/COBEP.2011.6085268
  • Filename
    6085268