Title :
Development of Metal Inspection System Exploiting Magnetoresistive Sensors
Author :
Elshafiey, Ibrahim ; Mohra, Ashraf
Author_Institution :
Dept. of Electr. Eng., King Saud Univ., Riyadh
Abstract :
Advances in magnetoresistive (MR) type sensors provide a new technique for nondestructive evaluation NDE of metal structures. MR sensors include high sensitivity and reduced size being produced by thin film processing techniques, the manufacturing cost of these sensors is low. This paper provides an attempt to develop an NDE system that depends on one type of MR sensors, namely the giant MR (GMR) elements. An example is considered of detecting defects in printed circuit boards. System details and experimental results are provided. Computational modeling validation is introduced based on finite element analysis
Keywords :
finite element analysis; giant magnetoresistance; magnetoresistive devices; nondestructive testing; printed circuits; finite element analysis; giant magnetoresistive sensors; metal inspection system; metal structures; nondestructive evaluation; printed circuit boards; thin film processing; Computational modeling; Costs; Giant magnetoresistance; Inspection; Magnetic sensors; Manufacturing processes; Printed circuits; Sensor systems; Thin film circuits; Thin film sensors;
Conference_Titel :
System-on-Chip for Real-Time Applications, The 6th International Workshop on
Conference_Location :
Cairo
Print_ISBN :
1-4244-0898-9
DOI :
10.1109/IWSOC.2006.348226
