Title :
Modeling Technology of Functional and Reliable Behavior Algorithms in Electronic Complexes
Author :
Volochiy, Bohdan
fDate :
Feb. 28 2006-March 4 2006
Abstract :
The proposed modeling technology is based on the use of Markov process and differs from traditional technology by its formalized procedure of model development in the form of state and transition graph. The opportunity of process automation of Markov model development and their analysis is provided.
Keywords :
Markov processes; electronic engineering computing; Markov process; behavior algorithms; electronic complexes; modeling technology; process automation; Automation; Differential equations; Information analysis; Information systems; Markov processes; Mathematical model; Packaging; Power supplies; Power system modeling; Power system reliability; Markov model; electronic system; fault-tolerant system;
Conference_Titel :
Modern Problems of Radio Engineering, Telecommunications, and Computer Science, 2006. TCSET 2006. International Conference
Conference_Location :
Lviv-Slavsko
Print_ISBN :
966-553-507-2
DOI :
10.1109/TCSET.2006.4404432
