DocumentCode :
2396137
Title :
Impact of channel estimation error on decentralized detection in bandwidth constrained wireless sensor networks
Author :
Ahmadi, Hamid R. ; Vosoughi, Azadeh
Author_Institution :
ECE Dept., Univ. of Rochester, Rochester, NY
fYear :
2008
fDate :
16-19 Nov. 2008
Firstpage :
1
Lastpage :
7
Abstract :
In this paper we consider the problem of fusing decisions in a distributed detection system when the local binary decisions made at the sensors are transmitted over wireless links subject to fading and noise. We consider a training based channel estimator with which the fusion center (FC) estimates the complex channels between the sensors and the FC. We derive the likelihood-ratio-test (LRT) fusion rules that incorporate the complex channel estimates for the cases where the sensors employ BPSK, OOK, binary FSK, and binary PPM signaling to modulate their binary local decisions. We study the effect of channel estimation error on the system performance. As a benchmark we compare it with a fusion rule that assumes perfect channel state information (CSI). Performance evaluation shows that as SNR increases the channel estimation error decreases and the system performance approaches to the clairvoyant scenario where perfect CSI is assumed at the FC.
Keywords :
binary decision diagrams; channel estimation; error analysis; modulation; radio links; sensor fusion; wireless sensor networks; BPSK; OOK; bandwidth constrained wireless sensor networks; binary FSK; binary PPM signaling; channel estimation error; channel state information; decentralized detection; distributed detection system; fusion center; likelihood-ratio-test fusion rules; local binary decisions; training based channel estimator; wireless links; Bandwidth; Binary phase shift keying; Channel estimation; Fading; Frequency shift keying; Light rail systems; Sensor fusion; Sensor systems; System performance; Wireless sensor networks;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Military Communications Conference, 2008. MILCOM 2008. IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-2676-8
Electronic_ISBN :
978-1-4244-2677-5
Type :
conf
DOI :
10.1109/MILCOM.2008.4753254
Filename :
4753254
Link To Document :
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