• DocumentCode
    2396444
  • Title

    Using contours to detect and localize junctions in natural images

  • Author

    Maire, Michael ; Arbeláez, Pablo ; Fowlkes, Charless ; Malik, Jitendra

  • Author_Institution
    California Univ., Berkeley, CA
  • fYear
    2008
  • fDate
    23-28 June 2008
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    Contours and junctions are important cues for perceptual organization and shape recognition. Detecting junctions locally has proved problematic because the image intensity surface is confusing in the neighborhood of a junction. Edge detectors also do not perform well near junctions. Current leading approaches to junction detection, such as the Harris operator, are based on 2D variation in the intensity signal. However, a drawback of this strategy is that it confuses textured regions with junctions. We believe that the right approach to junction detection should take advantage of the contours that are incident at a junction; contours themselves can be detected by processes that use more global approaches. In this paper, we develop a new high-performance contour detector using a combination of local and global cues. This contour detector provides the best performance to date (F=0.70) on the Berkeley Segmentation Dataset (BSDS) benchmark. From the resulting contours, we detect and localize candidate junctions, taking into account both contour salience and geometric configuration. We show that improvements in our contour model lead to better junctions. Our contour and junction detectors both provide state of the art performance.
  • Keywords
    edge detection; Berkeley Segmentation Dataset benchmark; contour detection; edge detectors; junction detection; junction localization; natural images; perceptual organization; shape recognition; Brightness; Computer vision; Detectors; Filters; Humans; Image edge detection; Image recognition; Object detection; Semiconductor counters; Shape;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition, 2008. CVPR 2008. IEEE Conference on
  • Conference_Location
    Anchorage, AK
  • ISSN
    1063-6919
  • Print_ISBN
    978-1-4244-2242-5
  • Electronic_ISBN
    1063-6919
  • Type

    conf

  • DOI
    10.1109/CVPR.2008.4587420
  • Filename
    4587420