DocumentCode :
2396449
Title :
A Novel Technique For The Measurement Of Photoenhanced Electron Attachment: Implications For An Optically-controlled Diffuse Discharge Opening Switch
Author :
Pinnaduwage, Lal A. ; Christophoicu, L.G.
Author_Institution :
Oak Ridge National Laboratory
fYear :
1991
fDate :
16-19 June 1991
Firstpage :
486
Lastpage :
490
Abstract :
Enhanced electron attachment to transient electron attaching species, such as electronically-excited molecules produced via laser irradiation, could be employed to switch conduction/insulation properties of a gaseous medium and has potential applications in diffuse-discharge opening switches. In this paper, we discuss a new technique that is capable of measurement of enhanced electron attachment to very short-lived (lifetime < 10/sup -8/s) electron attaching species. We also report measurements carried out using this technique on superexcited states (electronically-excited states lying above the first ionization threshold) of triethylamine and nitric oxide; these exhibit several orders of magnitude enhancement in electron attachment compared to the corresponding ground electronic states. Implications of such measurements for an optically-controlled diffuse discharge opening switch are indicated.
Keywords :
Atom optics; Atomic beams; Electron optics; Inductors; Ionization; Joining processes; Laser excitation; Optical pulses; Optical switches; Physics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pulsed Power Conference, 1991. Digest of Technical Papers. Eighth IEEE International
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-0177-3
Type :
conf
DOI :
10.1109/PPC.1991.733327
Filename :
733327
Link To Document :
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