Title :
Parallel Genetic Algorithm of Test Generation For Digital Circuits
Author :
Skobtsov, Y.A. ; El-Khatib, A.I. ; Ivanov, D.E.
Author_Institution :
Donetsk Nat. Tech. Univ., Donetsk
fDate :
Feb. 28 2006-March 4 2006
Abstract :
The parallel genetic algorithms are considered for problem of test generation. The different forms of parallelization of genetic algorithms are investigated for test generation.
Keywords :
digital circuits; genetic algorithms; integrated circuit testing; digital circuits; parallel genetic algorithm; test generation; Automatic testing; Circuit testing; Data processing; Digital circuits; Electronics packaging; Genetic algorithms; Genetic programming; Logic testing; Parallel processing; Sequential circuits; digital circuits; genenic algorithms; parallel calculations; test generation;
Conference_Titel :
Modern Problems of Radio Engineering, Telecommunications, and Computer Science, 2006. TCSET 2006. International Conference
Conference_Location :
Lviv-Slavsko
Print_ISBN :
966-553-507-2
DOI :
10.1109/TCSET.2006.4404471
