• DocumentCode
    2396684
  • Title

    Learning class-specific affinities for image labelling

  • Author

    Batra, Dhruv ; Sukthankar, Rahul ; Chen, Tsuhan

  • Author_Institution
    Carnegie Mellon Univ., Pittsburgh, PA
  • fYear
    2008
  • fDate
    23-28 June 2008
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    Spectral clustering and eigenvector-based methods have become increasingly popular in segmentation and recognition. Although the choice of the pairwise similarity metric (or affinities) greatly influences the quality of the results, this choice is typically specified outside the learning framework. In this paper, we present an algorithm to learn class-specific similarity functions. Mapping our problem in a conditional random fields (CRF) framework enables us to pose the task of learning affinities as parameter learning in undirected graphical models. There are two significant advances over previous work. First, we learn the affinity between a pair of data-points as a function of a pairwise feature and (in contrast with previous approaches) the classes to which these two data-points were mapped, allowing us to work with a richer class of affinities. Second, our formulation provides a principled probabilistic interpretation for learning all of the parameters that define these affinities. Using ground truth segmentations and labellings for training, we learn the parameters with the greatest discriminative power (in an MLE sense) on the training data. We demonstrate the power of this learning algorithm in the setting of joint segmentation and recognition of object classes. Specifically, even with very simple appearance features, the proposed method achieves state-of-the-art performance on standard datasets.
  • Keywords
    eigenvalues and eigenfunctions; image recognition; image segmentation; probability; class-specific similarity functions; conditional random fields; eigenvector-based methods; graphical models; image labelling; learning class-specific affinities; object recognition; object segmentation; pairwise similarity metrics; principled probabilistic interpretation; spectral clustering; Birds; Clustering algorithms; Computer vision; Cost function; Graphical models; Image recognition; Image segmentation; Labeling; Maximum likelihood estimation; Training data;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition, 2008. CVPR 2008. IEEE Conference on
  • Conference_Location
    Anchorage, AK
  • ISSN
    1063-6919
  • Print_ISBN
    978-1-4244-2242-5
  • Electronic_ISBN
    1063-6919
  • Type

    conf

  • DOI
    10.1109/CVPR.2008.4587432
  • Filename
    4587432