DocumentCode
2396853
Title
A study of the difference between partial derivative and stochastic neural network sensitivity analysis for applications in supervised pattern classification problems
Author
Ng, Wing W Y ; Yeung, Daniel S. ; Wang, Xi-Zhao ; Cloete, Ian
Author_Institution
Dept. of Comput., Hong Kong Polytech. Univ., Kowloon, China
Volume
7
fYear
2004
fDate
26-29 Aug. 2004
Firstpage
4283
Abstract
This work provides a brief development roadmap of the neural network sensitivity analysis, from 1960´s to now on. The two main streams of the sensitivity measures: partial derivative and stochastic sensitivity measures are compared. The partial derivative sensitivity (PD-SM) finds the rate of change of the network output with respect to parameter changes, while the stochastic sensitivity (ST-SM) finds the magnitudes of the output perturbations between the original training samples and the perturbed samples, in statistical sense. Their computational complexities are compared. Furthermore, how to evaluate multiple parameters of the neural network with or without correlation are explored too. In addition, the differences of them in the application of supervised pattern classification problems are also discussed. The evaluations are based on three major applications of sensitivity analysis in supervised pattern classification problems: feature selection, sample selection and neural network generalization assessment. ST-SM and PD-SM of the RBFNN are used for investigations.
Keywords
computational complexity; feature extraction; generalisation (artificial intelligence); learning (artificial intelligence); partial differential equations; pattern classification; radial basis function networks; sampling methods; sensitivity analysis; stochastic processes; RBFNN; computational complexity; feature selection; multiple parameters evaluation; neural network generalization; partial derivative sensitivity; perturbed samples; sample selection; statistical analysis; stochastic neural network; stochastic sensitivity analysis; supervised pattern classification problems; training samples; Application software; Artificial neural networks; Computer networks; Computer science; Intelligent networks; Mathematics; Neural networks; Pattern classification; Sensitivity analysis; Stochastic processes;
fLanguage
English
Publisher
ieee
Conference_Titel
Machine Learning and Cybernetics, 2004. Proceedings of 2004 International Conference on
Print_ISBN
0-7803-8403-2
Type
conf
DOI
10.1109/ICMLC.2004.1384590
Filename
1384590
Link To Document