Title :
Incorporating voltage/reactive representation to short-term generation scheduling models
Author :
Nepomuceno, L. ; Oliveira, A.R.L. ; Ohishi, T.
Author_Institution :
Sao Paulo Univ., Brazil
Abstract :
This paper proposes a methodology to incorporate voltage/reactive representation to short term generation scheduling (STGS) models, which is based on active/reactive decoupling characteristics of power systems. In such an approach STGS is decoupled in both active (AGS) and reactive (RGS) generation scheduling models. AGS model establishes an initial active generation scheduling through a traditional dispatch model. The scheduling proposed by AGS model is evaluated from the voltage/reactive points of view, through the proposed RGS model. RGS is formulated as a sequence of T nonlinear OPF problems, solved separately but taking into account load tracking between consecutive time intervals. This approach considerably reduces computational effort to perform the reactive analysis of the RGS problem as a whole. When necessary, the RGS model is capable of proposing active generation redispatches, such that critical reactive problems (in which all reactive variables have been insufficient to control the reactive problems) can be overcome. The formulation and solution methodology proposed are evaluated in the IEEE 30-bus system in two case studies. These studies show that the methodology is robust enough to incorporate reactive aspects to STGS problem.
Keywords :
load flow; power generation scheduling; reactive power; IEEE 30-bus system; T nonlinear OPF problems; active/reactive decoupling characteristics; consecutive time intervals; dispatch model; load tracking; reactive analysis; short-term generation scheduling models; voltage/reactive representation; Brazil Council; Character generation; Load flow; Power generation; Power generation economics; Power system modeling; Power system security; Processor scheduling; Production planning; Voltage;
Conference_Titel :
Power Engineering Society Summer Meeting, 2002 IEEE
Conference_Location :
Chicago, IL, USA
Print_ISBN :
0-7803-7518-1
DOI :
10.1109/PESS.2002.1043649