Title :
SLASH-An RVLSI CAD system
Author :
Frankel, Robert ; Hunt, James J. ; Van Alstyne, Marshall ; Young, George
Author_Institution :
MIT Lincoln Lab., Lexington, MA, USA
Abstract :
The restructurable VLSI (RVLSI) CAD tool SLASH aids the user in carrying out the four-part RVLSI layout/restructuring task, which consists of: creation of a wafer-scale layout, analysis of capacitance test data to determine the location of defects on a particular wafer, mapping (placement and routing) of a logical system onto the usable resources of a particular wafer, and an incremental restructure-and-test cycle during which laser operations implement the prescribed layout. SLASH brings many modules to bear on the task of carrying out these functions. These modules include graphics workstation-based editors, as well as stand-alone `batch´ programs
Keywords :
VLSI; circuit CAD; laser beam machining; redundancy; CAD tool; SLASH; capacitance test data; graphics workstation-based editors; incremental restructure-and-test cycle; layout/restructuring task; mapping; placement; restructurable VLSI; routing; usable resources; wafer-scale layout; Circuit testing; Design automation; Graphics; Laboratories; Layout; Logic testing; Routing; Signal processing; System testing; Target tracking;
Conference_Titel :
Wafer Scale Integration, 1989. Proceedings., [1st] International Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-8186-9901-9
DOI :
10.1109/WAFER.1989.47533
