Title :
Normalized tree partitioning for image segmentation
Author :
Wang, Jingdong ; Jia, Yangqing ; Hua, Xian-Sheng ; Zhang, Changshui ; Quan, Long
Author_Institution :
Microsoft Res. Asia, Beijing
Abstract :
In this paper, we propose a novel graph based clustering approach with satisfactory clustering performance and low computational cost. It consists of two main steps: tree fitting and partitioning. We first introduce a probabilistic method to fit a tree to a data graph under the sense of minimum entropy. Then, we propose a novel tree partitioning method under a normalized cut criterion, called normalized tree partitioning (NTP), in which a fast combinatorial algorithm is designed for exact bipartitioning. Moreover, we extend it to k-way tree partitioning by proposing an efficient best-first recursive bipartitioning scheme. Compared with spectral clustering, NTP produces the exact global optimal bipartition, introduces fewer approximations for k-way partitioning and can intrinsically produce superior performance. Compared with bottom-up aggregation methods, NTP adopts a global criterion and hence performs better. Last, experimental results on image segmentation demonstrate that our approach is more powerful compared with existing graph-based approaches.
Keywords :
approximation theory; combinatorial mathematics; entropy; image segmentation; pattern clustering; probability; trees (mathematics); best-first recursive bipartitioning scheme; combinatorial algorithm; computational cost; global optimal bipartition; graph based clustering approach; image segmentation; k-way partitioning approximations; k-way tree partitioning; minimum entropy; normalized cut criterion; normalized tree partitioning; probabilistic method; spectral clustering; tree fitting; Algorithm design and analysis; Asia; Clustering algorithms; Clustering methods; Computational efficiency; Entropy; Image segmentation; Joining processes; Pattern recognition; Tree graphs;
Conference_Titel :
Computer Vision and Pattern Recognition, 2008. CVPR 2008. IEEE Conference on
Conference_Location :
Anchorage, AK
Print_ISBN :
978-1-4244-2242-5
Electronic_ISBN :
1063-6919
DOI :
10.1109/CVPR.2008.4587454