DocumentCode
2397168
Title
A module-sliced high yield WSI memory system
Author
Chang, Yi-Chieh ; Jorge, Saji ; Kim, Jung Hwan
Author_Institution
Dept. of Electr. & Comput. Eng., Texas Univ., El Paso, TX, USA
fYear
1995
fDate
18-20 Jan 1995
Firstpage
91
Lastpage
100
Abstract
Low yield is one of the practical difficulties in the design of WSI systems, such as array processors or WSI memories. The conventional row-column memory cells organization is not suitable for WSI memory systems due to the long signal delay on a wafer and a much more complicate procedure for replacing a defect row or column of memory cell. To alleviate these difficulties, a module-sliced WSI memory system is proposed for high yield WSI memory systems. The basic unit of the WSI memory system is a module which consists of a memory bank, a module comparator, a module register, and a row-column decoder. The WSI memory system is organized in a two level row/column structure. The first level is a two dimensional mesh with the basic unit of a module. Within each module, i.e. the second level, the memory bank is organized in a conventional rows and columns of memory cells
Keywords
fault tolerant computing; integrated circuit yield; integrated memory circuits; memory architecture; modules; wafer-scale integration; WSI memories; array processors; memory bank; module comparator; module register; module-sliced system; row-column decoder; row-column memory cells; two dimensional mesh; yield; Decoding; Delay; Fault tolerance; Fault tolerant systems; Hardware; Indium; Registers; Signal processing; Very large scale integration; Wafer scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Wafer Scale Integration, 1995. Proceedings., Seventh Annual IEEE International Conference on
Conference_Location
San Francisco, CA
Print_ISBN
0-7803-2467-6
Type
conf
DOI
10.1109/ICWSI.1995.515442
Filename
515442
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