Title : 
Time redundancy for error detecting neural networks
         
        
            Author : 
Hsu, Yuang-Ming ; Piuri, Vincenzo ; Swartzlander, Earl E., Jr.
         
        
            Author_Institution : 
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
         
        
        
        
        
        
            Abstract : 
Concurrent error detection at an architectural level is often a basic requirement to achieve fault tolerance in neural networks for mission-critical applications. Time redundancy allows for concurrent error detection with low circuit complexity. In this paper, the use of alternating logic and complemented logic are analyzed as low-cost approaches to concurrent error detection. Different architectural approaches for the neural network design are considered to march the implementation constraints
         
        
            Keywords : 
error detection; fault tolerant computing; neural net architecture; neural nets; redundancy; alternating logic; circuit complexity; complemented logic; concurrent error detection; fault tolerance; mission-critical applications; neural network architecture; time redundancy; Circuit faults; Complexity theory; Computer errors; Computer networks; Error correction; Fault detection; Logic; Mission critical systems; Neural networks; Redundancy;
         
        
        
        
            Conference_Titel : 
Wafer Scale Integration, 1995. Proceedings., Seventh Annual IEEE International Conference on
         
        
            Conference_Location : 
San Francisco, CA
         
        
            Print_ISBN : 
0-7803-2467-6
         
        
        
            DOI : 
10.1109/ICWSI.1995.515444