On the test quality evaluation of current testing techniques

This paper presents a new defect level/yield loss framework to estimate test quality of current testing techniques. We use this framework to compare the traditional I_DDQ single-threshold approach to alternative techniques such as current ratios and a new one based on multiple thresholds. Results show that the choice of a current testing technique (and the setting of thresholds) greatly depends on the defect level target. Results also reveal that the multiple-threshold technique offers the lowest yield loss