• DocumentCode
    2397659
  • Title

    Research accomplishments at the University of Arizona SEMATECH Center of Excellence for contamination/defect assessment and control

  • Author

    Parks, H.G. ; O´Hanlon, J.F. ; Shadman, F.

  • Author_Institution
    Arizona Univ., Tucson, AZ, USA
  • fYear
    1991
  • fDate
    21-23 Oct 1991
  • Firstpage
    9
  • Lastpage
    16
  • Abstract
    The Arizona SEMATECH Center of Excellence (SCOE) was established in May of 1988. The SCOE is engaged in research on a broad front to understand and control contamination which causes yield-limiting defects in submicron ULSI circuits. Sandia National Laboratory personnel are integrated with UA personnel in the SCOE research. The focus of the research is on contaminants, both particulates and homogeneous or distributed, which originate in, are caused by, or are transported and deposited by process gases and chemicals or process equipment. Further, the work involves investigating the mapping from contaminants and contaminant levels to circuit defects for submicron processes and circuit technologies. Results achieved during the three years of SCOE´s existence are described
  • Keywords
    VLSI; integrated circuit technology; SEMATECH Center of Excellence; circuit defects; circuit technologies; contaminant levels; contamination/defect assessment; particulates; process equipment; process gases; submicron ULSI circuits; yield-limiting defects; Biomembranes; Ceramics; Chemical engineering; Chemical technology; Circuits; Contamination; Gases; Impurities; Laboratories; Purification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference and Workshop, 1991. ASMC 91 Proceedings. IEEE/SEMI 1991
  • Conference_Location
    Boston, MA
  • Print_ISBN
    0-7803-0152-8
  • Type

    conf

  • DOI
    10.1109/ASMC.1991.167374
  • Filename
    167374