DocumentCode
2397748
Title
[Breaker page]
fYear
2005
fDate
1-1 May 2005
Firstpage
57
Lastpage
57
Abstract
Breaker page.
fLanguage
English
Publisher
ieee
Conference_Titel
Current and Defect Based Testing, 2005. DBT 2005. Proceedings. 2005 IEEE International Workshop on
Conference_Location
Palm Springs, CA
Print_ISBN
1-4244-0034-1
Type
conf
DOI
10.1109/DBT.2005.1531304
Filename
1531304
Link To Document