Title :
An introduction to computer algorithms designed to facilitate IDDT current testing of CMOS circuits
Author_Institution :
Dept. of ECE, North Carolina Univ., Charlotte, NC
Abstract :
This work presents an overview of a new computer algorithm and a computer aided design (CAD) tool. Both of these prove to be useful for dynamic power supply current test methods. In the growing field of iDDT testing many analysis tools that have existed for decades can be used effectively to provide various its levels of results. However, new fields of study often require new tools. This work presents an introduction to the "Toggle" algorithm and the "Mapper" CAD tool. These tools can be used to advance the study and practice of iDDT testing as well as other testing methods
Keywords :
CMOS integrated circuits; circuit CAD; circuit analysis computing; integrated circuit testing; CMOS circuits; Mapper CAD tool; Toggle algorithm; computer aided design tool; dynamic supply current; iDDT current testing; power supply current; Algorithm design and analysis; Automatic test pattern generation; Circuit faults; Circuit noise; Circuit testing; Current measurement; Delay; Integrated circuit measurements; Switches; Switching circuits;
Conference_Titel :
Current and Defect Based Testing, 2005. DBT 2005. Proceedings. 2005 IEEE International Workshop on
Conference_Location :
Palm Springs, CA
Print_ISBN :
1-4244-0034-1
DOI :
10.1109/DBT.2005.1531307
