Title :
A knowledge-based environment for the integration of logical and physical testing of VLSI circuits
Author :
Dollas, Apostolos ; Castrodale, Grant L. ; Krakow, William T.
Author_Institution :
Dept. of Electr. Eng., Duke Univ., Durham, NC, USA
Abstract :
The authors have developed an application environment for VLSI design, under which the VLSI design tools as well as the testers can be run. They have also developed a knowledge-based system for the transparent use of various testers from a common intermediate test-pattern language. Under the new environment, the user stimulates a design as before, and then specifies on which tester the fabricated design should be tested. The tests are performed with minimal user intervention (e.g. powering the circuit up). Upon completion of the physical testing the system compares the test data to the simulation data and graphically presents discrepancies which may indicate potential errors
Keywords :
VLSI; integrated logic circuits; knowledge based systems; logic CAD; logic testing; VLSI circuits; VLSI design tools; application environment; common intermediate test-pattern language; fabricated design; knowledge-based environment; physical testing; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Logic testing; Performance evaluation; Software testing; Software tools; System testing; Very large scale integration;
Conference_Titel :
Tools for Artificial Intelligence, 1989. Architectures, Languages and Algorithms, IEEE International Workshop on
Conference_Location :
Fairfax, VA
Print_ISBN :
0-8186-1984-8
DOI :
10.1109/TAI.1989.65329