Title :
Visual tracking via incremental Log-Euclidean Riemannian subspace learning
Author :
Li, Xi ; Hu, Weiming ; Zhang, Zhongfei ; Zhang, Xiaoqin ; Zhu, Mingliang ; Cheng, Jian
Author_Institution :
Nat. Lab. of Pattern Recognition, Chinese Acad. of Sci., Beijing
Abstract :
Recently, a novel Log-Euclidean Riemannian metric is proposed for statistics on symmetric positive definite (SPD) matrices. Under this metric, distances and Riemannian means take a much simpler form than the widely used affine-invariant Riemannian metric. Based on the Log-Euclidean Riemannian metric, we develop a tracking framework in this paper. In the framework, the covariance matrices of image features in the five modes are used to represent object appearance. Since a nonsingular covariance matrix is a SPD matrix lying on a connected Riemannian manifold, the Log-Euclidean Riemannian metric is used for statistics on the covariance matrices of image features. Further, we present an effective online Log-Euclidean Riemannian subspace learning algorithm which models the appearance changes of an object by incrementally learning a low-order Log-Euclidean eigenspace representation through adaptively updating the sample mean and eigenbasis. Tracking is then led by the Bayesian state inference framework in which a particle filter is used for propagating sample distributions over the time. Theoretic analysis and experimental evaluations demonstrate the promise and effectiveness of the proposed framework.
Keywords :
Bayes methods; computational geometry; covariance matrices; eigenvalues and eigenfunctions; image representation; learning (artificial intelligence); particle filtering (numerical methods); sampling methods; tracking; Bayesian state inference framework; image feature; incremental log-Euclidean Riemannian subspace learning algorithm; log-Euclidean eigenspace representation; nonsingular covariance matrix; object appearance representation; particle filter; sample mean distribution; symmetric positive definite matrix; visual tracking; Cameras; Covariance matrix; Inference algorithms; Kernel; Lighting; Particle filters; Particle tracking; Principal component analysis; Robustness; Statistics;
Conference_Titel :
Computer Vision and Pattern Recognition, 2008. CVPR 2008. IEEE Conference on
Conference_Location :
Anchorage, AK
Print_ISBN :
978-1-4244-2242-5
Electronic_ISBN :
1063-6919
DOI :
10.1109/CVPR.2008.4587516