Title :
A Low-Cost Power-Quality Meter With Series Arc-Fault Detection Capability for Smart Grid
Author :
Koziy, Kostyantyn ; Bei Gou ; Aslakson, J.
Author_Institution :
North Dakota State Univ., Fargo, ND, USA
Abstract :
This paper presents a low-cost digital single-phase power-quality measurement device for consumer use with a wide range of features, including series arc-fault detection, load trip on failure, and phase/neutral line wiring mix up indication. A wavelet multiresolution analysis technique was utilized for the voltage transient event detection and the current drop pattern recognition, specifically to arc fault. The last feature also involved the use of adaptive thresholding, peak detection, and repetition frequency calculation. A computationally efficient and accurate Goertzel filter was used for total harmonic distortion calculation. In addition, this meter can measure phase fundamental frequency (using the zero-crossing technique), rms values, and power. MATLAB and MathCAD packages were used to build and simulate arc-fault model and phase voltage distortion, to design and test part of the developed algorithms, which were further implemented in Embedded C and Assembler programming languages. A prototype circuit board with the required sensors and relay, analog isolation, indication, user controls, communication link, and a low-cost microchip microcontroller (MCU) dsPIC33 was designed and built to validate implemented algorithms and conduct experiments.
Keywords :
mathematics computing; power meters; power supply quality; smart power grids; wavelet transforms; C programming languages; Goertzel filter; MATLAB; MCU; MathCAD; analog isolation; arc fault; arc-fault detection; arc-fault model; assembler programming languages; circuit board; communication link; current drop pattern recognition; digital single-phase power-quality measurement device; dsPIC33; low-cost power-quality meter; microchip microcontroller; phase voltage distortion; phase/neutral line wiring mix up indication; smart grid; total harmonic distortion calculation; user controls; voltage transient event detection; wavelet multiresolution analysis technique; zero-crossing technique; Algorithm design and analysis; Circuit faults; Current measurement; Harmonic analysis; Mathematical model; Monitoring; Wavelet transforms; Arc fault; Goertzel algorithm; microcontroller; power quality (PQ); smart meter; total harmonic distortion (THD); wavelet;
Journal_Title :
Power Delivery, IEEE Transactions on
DOI :
10.1109/TPWRD.2013.2251753