Title :
Hierarchical Testing of Complex Digital Systems
Author :
Hahanov, Vladimir ; Obrizan, Volodymyr ; Yeliseev, Vladimir ; Ghribi, Wade
Author_Institution :
Kharkiv Nat. Univ. of Radio Electron., Kharkiv
fDate :
Feb. 28 2006-March 4 2006
Abstract :
This paper offers approach to complex digital system testing based on hierarchy scaling during diagnosis experiment. Several models of testing are proposed. Main principles of testing system organization are given. Such approach allows significant reducing overall system testing and diagnostics time.
Keywords :
IEEE standards; circuit testing; digital signal processing chips; digital systems; complex digital system testing; complex digital systems; diagnosis experiment; hierarchical testing; hierarchy scaling; Circuit faults; Circuit testing; Digital systems; Electronic equipment testing; Integrated circuit modeling; Integrated circuit testing; Logic testing; Network-on-a-chip; Standards organizations; System testing; IEEE 1500 SECT; diagnostics; program-technical complex; testing;
Conference_Titel :
Modern Problems of Radio Engineering, Telecommunications, and Computer Science, 2006. TCSET 2006. International Conference
Conference_Location :
Lviv-Slavsko
Print_ISBN :
966-553-507-2
DOI :
10.1109/TCSET.2006.4404571
