Title :
Time-Jitter and Instabilities of Gbit/S IC´S Caused by Transmission-Line Interconnections
Author :
Hauenschild, J. ; Rein, H.-M.
Author_Institution :
Ruhr-Univ. Bochum, Bochum, Germany
Abstract :
The influence of transmission-line interconnections between high-speed IC´s on time jitter and oscillations is investigated. Simple but flexible methods for estimating these effects are proposed and proved by measurements. The estimations are based on small-signal S-parameter simulations (or measurements). Moreover, various line terminations are discussed. A special Gbit/s bipolar IC was fabricated for the experiments.
Keywords :
S-parameters; bipolar integrated circuits; high-speed integrated circuits; integrated circuit interconnections; integrated circuit manufacture; IC; bipolar integrated circuits; high-speed integrated circuits; oscillations; small-signal S-parameter simulations; time jitter; transmission-line interconnections; Arithmetic; CMOS process; Energy consumption; Hardware; Inverters; Protection; Public key cryptography; Tail; Testing; Transmission lines;
Conference_Titel :
Solid-State Circuits Conference, 1989. ESSCIRC '89. Proceedings of the 15th European
Conference_Location :
Vienna
Print_ISBN :
3-85403-101-7
DOI :
10.1109/ESSCIRC.1989.5468081
