Title :
Constant envelope waveforms for use on HF multipath fading channels
Author_Institution :
Harris Corp., Rochester, NY
Abstract :
Modern single-carrier HF waveforms require tight digital and analog filters in order to meet current HF bandwidth allocations. Unfortunately, this filtering process produces a large variation in the peak-power of the waveform relative to the average-power (about 3-6 dB depending on the symbol modulation). The effect of this peak power to average power ratio (PAPR) is that an average power back-off is required at the input to a power-amplifier (PA) (when using a peak-power limited PA) to avoid operating in the non-linear region of the PA. Similarly, orthogonal frequency division multiplexing (OFDM) waveforms suffer from an even larger PAPR, typically 6-14 dB. An alternative to these waveforms is to use constant-amplitude (or envelope) waveforms such as continuous phase modulation (CPM) or constant envelope OFDM (CE-OFDM). This paper will investigate the potential of modifying the low data rate waveforms in US MIL-STD-188-110B (110B) with constant-amplitude variants in an effort to improve on-air performance by maximizing the average transmit power. These new constant envelope waveforms will be compared to the standardized 110B single-carrier HF waveforms and to new candidate OFDM waveforms on several HF channels in order to understand the performance trade-offs offered by the new waveforms.
Keywords :
OFDM modulation; continuous phase modulation; fading channels; multipath channels; power amplifiers; HF multipath fading channels; average power ratio; constant envelope waveforms; constant-amplitude waveforms; continuous phase modulation; filtering process; modern single-carrier HF waveforms; orthogonal frequency division multiplexing; power-amplifier; Channel allocation; Fading; Frequency; Hafnium; Noise measurement; OFDM modulation; Peak to average power ratio; Power amplifiers; Power measurement; Signal to noise ratio;
Conference_Titel :
Military Communications Conference, 2008. MILCOM 2008. IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-2676-8
Electronic_ISBN :
978-1-4244-2677-5
DOI :
10.1109/MILCOM.2008.4753422