Title :
Time-resolved optical nonlinearity measurement by a two color pump-probe ellipsometry in InAs quantum dot waveguide
Author :
Kanamoto, Kyozo ; Nakamura, Hitoshi ; Nakamura, Yusui ; Sugimoto, Yoshimasa ; Asakawa, Kiyoshi ; Ishikawa, Hiroshi
Author_Institution :
Femtosecond Technol. Res. Assoc., Tsukuba, Japan
Abstract :
We have developed a two color pump-probe ellipsometry for the measurement of the optical nonlinear phase shift in a waveguide with quantum dot (QD) core layers. The key point of the method is to utilize the large polarization-dependent property in the optical nonlinearity arising from a flat-dome-like shape of the QDs. In this paper we report the time resolved behavior of the nonlinear response in the QD waveguides obtained by this method. Optical phase shift of more than π/2 rad was obtained by a pumping of 30 pJ/μm2. Delay time dependence of the phase shift is discussed in connection with the carrier dynamics.
Keywords :
III-V semiconductors; delays; ellipsometry; high-speed optical techniques; indium compounds; light polarisation; nonlinear optics; optical phase shifters; optical pumping; optical variables measurement; optical waveguides; probes; semiconductor quantum dots; InAs; InAs quantum dot waveguide; QD core layer; carrier dynamics; color pump-probe ellipsometry; delay time dependence; flat-dome-like QD shape; optical nonlinear phase shift; polarization-dependent property; time-resolved optical nonlinearity measurement; Delay; Ellipsometry; Nonlinear optics; Optical pumping; Optical waveguides; Polarization; Probes; Quantum dots; US Department of Transportation; Ultrafast optics;
Conference_Titel :
Lasers and Electro-Optics Society, 2003. LEOS 2003. The 16th Annual Meeting of the IEEE
Print_ISBN :
0-7803-7888-1
DOI :
10.1109/LEOS.2003.1252923