DocumentCode :
2399757
Title :
Exchangeability test on phase-change disks and testers
Author :
Ito, Takao ; Kubo, T. ; Yamada, Shigeru
fYear :
1994
fDate :
28 Aug-2 Sep 1994
Firstpage :
357
Lastpage :
357
Keywords :
Disk recording; Drives; Indium tin oxide; Materials testing; Optical noise; Optical recording; Optical sensors; Precision engineering; Servomechanisms; Standardization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Europe, 1994 Conference on
Print_ISBN :
0-7803-1789-0
Type :
conf
DOI :
10.1109/CLEOE.1994.636632
Filename :
636632
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2399757
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